Änderungen an Schritt Nr. 3
Bearbeitet von Brittany McCrigler –
Bearbeitung genehmigt von Brittany McCrigler
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| + | [* black] After pre-processing the chips are examined. It's best to see that your specimen is ready... |
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| + | [* black] ...ready for the transmission electron microscope (TEM). |
| + | [* black] This bad boy is handy when you want to know transistor strain, gate oxide thicknesses, or crystal lattice orientation. |
| + | [* black] Like the ion blaster, the TEM uses the shoot-first-ask-questions-later method by blasting electrons at its prey to see how they get along. |
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