Änderungen an Schritt Nr. 3
Bearbeitet von Sam Goldheart –
Bearbeitung genehmigt von Sam Goldheart
- Vorher
- Nachher
- Unverändert
Schritt-Zeilen
| [* black] After pre-processing the chips are examined. It's best to see that your specimen is ready... | |
| - | [* black] ...ready for the transmission electron microscope (TEM). |
| + | [* black] ...ready for the transmission electron microscope (TEM). |
| [* black] This bad boy is handy when you want to know transistor strain, gate oxide thicknesses, or crystal lattice orientation. | |
| - | [* black] Like the ion blaster, the TEM uses the shoot-first-ask-questions-later method by blasting electrons at its prey to see |
| - | [* black] We've had fun taking a tiny peek at Chipworks playground, but we've got to move on before the drool |
| + | [* black] Like the ion blaster, the TEM uses the [http://d3nevzfk7ii3be.cloudfront.net/igi/KLrtqTZ5DPhP2qUD|shoot-first-ask-questions-later|new_window=true] method by blasting electrons at its prey to see just what they're made of. |
| + | [* black] We've had fun taking a tiny peek at Chipworks's playground, but we've got to move on before the anticipatory drool leads to a series of keyboard replacements. |