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Änderungen an Schritt Nr. 3

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[* black] After pre-processing the chips are examined. It's best to see that your specimen is ready...
[* black] ...ready for the transmission electron microscope (TEM).
[* black] This bad boy is handy when you want to know transistor strain, gate oxide thicknesses, or crystal lattice orientation.
-[* black] Like the ion blaster, the TEM uses the [http://cdn4.www.babble.com/wp-content/uploads/2013/02/han-solo-new-star-wars.jpg|shoot-first-ask-questions-later|new_window=true] method by blasting electrons at its prey to see just what they're made of.
+[* black] Like the ion blaster, the TEM uses the [http://d3nevzfk7ii3be.cloudfront.net/igi/KLrtqTZ5DPhP2qUD|shoot-first-ask-questions-later|new_window=true] method by blasting electrons at its prey to see just what they're made of.
[* black] We've had fun taking a tiny peek at Chipworks's playground, but we've got to move on before the anticipatory drool leads to a series of keyboard replacements.